Single event upset studies using the ATLAS SCT

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Single Event Upset Studies for the ATLAS SCT and Pixel Optical Links

Optical data transmission has been chosen for the ATLAS Pixel and SemiConductor Tracker to deliver both timing and control information to the detector modules and transmit tracking data to the remote computer room. Radiation hardness of individuals optical components and their ASICs drivers have been reported in previous papers. We will report here the Single Event Upset studies carried out on ...

متن کامل

ATLAS SCT Hybrids Experience

The hybrids of ATLAS semi-conductor tracker (SCT) were made with Cu/Polyimide flex-circuits, reinforced with carbon-carbon substrates, in the barrel and in the endcap modules. We report successes, problems and solutions in the course of production of 2600 pieces of hybrids each.

متن کامل

Single Event Upset (SEU) in SRAM

Radiation in space is potentially hazardous to microelectronic circuits and systems such as spacecraft electronics. Transient effects on circuits and systems from high energetic particles can interrupt electronics operation or crash the systems. This phenomenon is particularly serious in complementary metal-oxide-semiconductor (CMOS) integrated circuits (ICs) since most of modern ICs are implem...

متن کامل

Single Event Upset at Ground Level

Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.

متن کامل

Single Event Upset Studies on the APV6 Front End Readout Chip

The microstrip tracker for the CMS experiment at the LHC will be read out using radiation hard APV chips. During high luminosity running of the LHC the tracker will be exposed to particle fluxes up to 10 cm s. This high rate of particles introduces a concern that the APV could occasionally suffer from Single Event Upset (SEU). In order to evaluate the expected upset rate the APV was run under c...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of Instrumentation

سال: 2014

ISSN: 1748-0221

DOI: 10.1088/1748-0221/9/01/c01050